Guangzhou, China

Guojin Luo

This inventor holds 1 USPTO granted patent. Top assignee: Guangzhou Termbray Electronics Tech Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Guojin Luo. Retrieved from https://idiyas.com/inventor/guojin-luo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Guojin Luo and a Method for Analyzing PCB Surface Quality.

Introduction

Guojin Luo is an inventor associated with Guangzhou, China, and Guangzhou Termbray Electronics Tech Co., Ltd. His work includes a patent for preparing and examining thin surface layers on printed circuit boards (PCBs).

Latest Patents

Luo is named on one patent, “Method for Analyzing Quality of Thin Surface Layer of PCB.” The method takes a test region from a PCB using scissors or an automatic sampler, applies gold spraying, and mounts the sample on a metal platform. It then deposits a first protective layer using an electron beam and a second protective layer using a focused ion beam. By adjusting the platform and sample angles, the method enables perpendicular cutting and observation of the sample surface. The preparation process is designed to avoid effects from chemical solutions, mechanical stress, and impurity contamination.

Career Highlights

Luo’s patent work addresses sample preparation and analysis for PCB surface layers. The disclosed approach uses electron-beam and focused-ion-beam deposition to protect the sample before examination.

Collaborations

Luo is associated with Guangzhou Termbray Electronics Tech Co., Ltd. His listed coworker is Jian Zheng.

Conclusion

Guojin Luo’s patent describes a controlled method for preparing and observing PCB surface samples while reducing potential preparation-related influences.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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