Beijing, China

Guohua Wei

This inventor holds 1 USPTO granted patent. Top assignee: Nuctech Company Limited. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Guohua Wei. Retrieved from https://idiyas.com/inventor/guohua-wei-lmzugubq

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Guohua Wei: Innovator in Security Inspection Technology

Introduction

Guohua Wei is a prominent inventor based in Beijing, China. He has made significant contributions to the field of security inspection technology. His innovative approach combines advanced imaging techniques to enhance safety and security measures.

Latest Patents

Guohua Wei holds 1 patent for a security inspection apparatus and method. This invention includes a CT inspection device and a Raman spectrum inspection device. The CT inspection device scans objects to generate CT images, which are then analyzed to identify potential hazardous articles. The Raman spectrum inspection device further analyzes these articles to determine their composition, ensuring thorough security checks.

Career Highlights

Guohua Wei is associated with Nuctech Company Limited, a leading provider of security inspection solutions. His work at Nuctech has positioned him as a key player in developing technologies that enhance public safety. His expertise in combining different inspection methods has led to more effective security protocols.

Collaborations

Guohua Wei has collaborated with notable colleagues, including Jianhong Zhang and Nei Yang. Their combined efforts have contributed to advancements in security technology and innovation.

Conclusion

Guohua Wei's contributions to security inspection technology demonstrate his commitment to enhancing safety through innovation. His work continues to influence the industry and improve security measures worldwide.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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