Guilin, China

Guohua Huang

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Other. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Guohua Huang. Retrieved from https://idiyas.com/inventor/guohua-huang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 9.0

ph-index = 1


Company Filing History:

goldMedal1 out of 834,453 
Other
 patents

Years Active: 2020

Loading Chart...
Loading Chart...
1 patent (USPTO):Explore Patents

Title: Guohua Huang: Innovator in Deflection Scanning Technology

Introduction

Guohua Huang is a notable inventor based in Guilin, China. He has made significant contributions to the field of deflection scanning technology. His innovative approach has led to the development of a unique device that enhances scanning accuracy in charged particle beam channels.

Latest Patents

Guohua Huang holds a patent for a "Deflection scanning device with multi-phase winding and deflection scanning system." This invention relates to a deflection scanning device characterized by an axisymmetric structure. It comprises a ferromagnetic frame and a deflection scanning winding, which includes a w-phase winding symmetrically distributed. The design aims to improve the uniformity of magnetic induction intensity, thereby reducing defocusing effects and enhancing scanning accuracy.

Career Highlights

Throughout his career, Guohua Huang has worked with various organizations, including Guilin Thd Technology Co., Ltd. His expertise in the field has allowed him to make substantial advancements in technology related to deflection scanning devices.

Collaborations

Guohua Huang has collaborated with notable individuals in his field, including Xiaodong Huang and Shouqi Wei. These partnerships have contributed to the development and refinement of his innovative technologies.

Conclusion

Guohua Huang's contributions to deflection scanning technology exemplify his commitment to innovation and excellence. His patent and collaborative efforts highlight his role as a significant figure in advancing this specialized field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…