Shenzhen, China

Guo-Zeng Zheng

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignees: Fih (Hong Kong) Limited, Shenzhen Futaihong Precision Industry Co., Ltd.. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Guo-Zeng Zheng. Retrieved from https://idiyas.com/inventor/guo-zeng-zheng

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Guo-Zeng Zheng: Innovator in Cross-Cut Testing Technology

Introduction

Guo-Zeng Zheng is a notable inventor based in Shenzhen, China. He has made significant contributions to the field of testing technology, particularly with his innovative cross-cut tester. His work has been recognized for its efficiency and cost-effectiveness in drawing lines.

Latest Patents

Guo-Zeng Zheng holds a patent for a cross-cut tester, which includes a handle with a receiving cavity and multiple blades. The design features an opening at one end of the handle and incorporates several gaskets that are positioned and detachably fixed within the receiving cavity. This invention effectively improves the efficiency of drawing lines while reducing costs.

Career Highlights

Throughout his career, Guo-Zeng Zheng has worked with prominent companies such as Fih (Hong Kong) Limited and Shenzhen Futaihong Precision Industry Co., Ltd. His experience in these organizations has contributed to his expertise in the field of precision testing instruments.

Collaborations

Guo-Zeng Zheng has collaborated with talented individuals in his field, including Jun-Wu Hu and Lei Cui. These partnerships have likely enhanced his innovative capabilities and contributed to the development of his patented technologies.

Conclusion

Guo-Zeng Zheng is a distinguished inventor whose work in cross-cut testing technology has made a significant impact. His innovative designs and collaborations reflect his commitment to advancing testing efficiency and reducing costs in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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