Incheon, South Korea

Gunyoung Lee

This inventor holds 1 USPTO granted patent. Top assignee: Amotech Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Gunyoung Lee. Retrieved from https://idiyas.com/inventor/gunyoung-lee-i1deps2z

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Gunyoung Lee: Innovator in Antenna Technology

Introduction

Gunyoung Lee is a notable inventor based in Incheon, South Korea. He has made significant contributions to the field of antenna technology, particularly with his innovative designs that enhance performance and reliability.

Latest Patents

Gunyoung Lee holds a patent for a "Feed pin, and patch antenna comprising same." This invention provides a feed pin designed with a step on its head to prevent cracks from forming in the soldering layer. The feed pin includes a feed head made of a conductive material in the shape of a plate, a stepped plate connected to the lower surface of the feed head, and a feed bar shaped as a polyhedron, which is also made of a conductive material.

Career Highlights

Gunyoung Lee is currently employed at Amotech Ltd., where he continues to develop innovative solutions in antenna technology. His work has been instrumental in advancing the capabilities of patch antennas, which are widely used in various communication devices.

Collaborations

Gunyoung collaborates with talented coworkers, including Taehyung Kim and Chul Huang, who contribute to the innovative environment at Amotech Ltd.

Conclusion

Gunyoung Lee's contributions to antenna technology exemplify the spirit of innovation in the field. His patent and ongoing work at Amotech Ltd. highlight his commitment to advancing technology and improving communication systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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