Zwischenwasser, Austria

Gunther Wohlgenannt

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Leica Microsystems (Schweiz) Ag. Active years: 2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Gunther Wohlgenannt. Retrieved from https://idiyas.com/inventor/gunther-wohlgenannt

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 24(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: Gunther Wohlgenannt: Innovator at Leica Microsystems

Introduction

Gunther Wohlgenannt is a notable inventor based in Bertschuns, Austria. He is currently associated with Leica Microsystems, a company renowned for its precision optics and imaging solutions. Despite having no patents to his name, Wohlgenannt's contributions to the field of microscopy and imaging technology are significant.

Latest Patents

As of now, Gunther Wohlgenannt holds 1 patents. This may reflect his focus on collaborative projects and contributions within his company rather than individual patent filings.

Career Highlights

Wohlgenannt has built a career at Leica Microsystems, where he has been involved in various innovative projects. His work has contributed to advancements in microscopy, enhancing the capabilities of researchers and professionals in various scientific fields.

Collaborations

Gunther Wohlgenannt collaborates with talented individuals such as Roger Spink and Benno Moser. These partnerships foster a creative environment that encourages innovation and the development of cutting-edge technologies.

Conclusion

In summary, Gunther Wohlgenannt is a dedicated inventor at Leica Microsystems, contributing to the field of microscopy through collaboration and innovation. His work, although not represented by patents, plays a crucial role in advancing imaging technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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