Brussels, Belgium

Gunter Maris

This inventor holds 1 USPTO granted patent. Top assignee: Tata Consultancy Services Limited. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Gunter Maris. Retrieved from https://idiyas.com/inventor/gunter-maris

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Gunter Maris and His Patent for Multi-Stage Testing Calibration.

Introduction

Gunter Maris is an inventor associated with Brussels, Belgium, and Tata Consultancy Services Limited. His patent work addresses calibration in multi-stage testing, where examinees may take different combinations of test modules but still need to be assessed on a common scale.

Latest Patents

Maris is associated with 1 patent: “Method and System for Multi-Stage Testing (MST) Calibration.” The invention describes a module-wise calibration approach that estimates a shift parameter from differences in average difficulty between pairs of modules. It then uses that estimate to align the modules’ average difficulty levels to a common scale. This approach is intended to help ensure that examinees who take different module combinations can be assessed comparably, while addressing computational and estimation challenges associated with existing methods.

Career Highlights

Maris’s listed patent work is connected to Tata Consultancy Services Limited. The invention focuses on a practical challenge in assessment design: maintaining comparability when tests are assembled from different modules.

Collaborations

The listed coworkers associated with Maris include Timo Bechger and Gaurav Tandon. Their names provide context for the professional connections accompanying the patent information.

Conclusion

Gunter Maris’s patent describes a method for aligning multi-stage test modules to a common difficulty scale, supporting more comparable assessments across different test combinations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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