Guiyuan Jia

**Title: Innovator Guiyuan Jia in Non-Contact Absolute Distance Measurement Technologies**

Introduction

Guiyuan Jia is an accomplished inventor based in Sichuan, China. He has made significant contributions to the field of non-contact absolute distance measurement technologies through his innovative patent work. His expertise is reflected in his ongoing research and development efforts at the Chinese Academy of Sciences.

Latest Patents

Guiyuan Jia holds a patent for an F-P sensor probe designed for absolute distance measurement. The patent encompasses an absolute distance measurement device and method, which utilizes a unique structure featuring a first N+1-core multimode optical fiber probe, an optical fiber sleeve, an imaging lens group, and a reference lens. This advanced configuration enhances the accuracy and efficiency of non-contact distance measuring by allowing the first N+1-core multimode optical fiber probe to function effectively in determining distances to various samples.

Career Highlights

Throughout his career, Guiyuan Jia has distinguished himself as a leader in the development of cutting-edge measurement technologies. His solitary patent exemplifies his ability to innovate and provide practical solutions to complex scientific challenges. Working at the prestigious Chinese Academy of Sciences, he has contributed to the advancement of optical measurement techniques which hold promise for various applications.

Collaborations

Guiyuan has collaborated with notable coworkers, including Xiangang Luo and Tiancheng Gong. These partnerships have facilitated the sharing of ideas and further innovation in their respective fields. Together, they aim to push the boundaries of existing measurement technologies and develop new applications for their inventions.

Conclusion

In conclusion, Guiyuan Jia stands out as an inventor with a keen focus on non-contact absolute distance measurement technologies. His patent for the F-P sensor probe demonstrates his commitment to innovation and the development of practical solutions. As he continues his work at the Chinese Academy of Sciences, his contributions are sure to influence the future of measurement technologies.