San Diego, CA, United States of America

Guilherme Medeiros Martins

This inventor holds 1 USPTO granted patent. Top assignee: Illumina Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Guilherme Medeiros Martins. Retrieved from https://idiyas.com/inventor/guilherme-medeiros-martins

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Guilherme Medeiros Martins: Inventor in Machine Learning-Based Genotyping

Introduction

Guilherme Medeiros Martins is an inventor based in San Diego, California, and is associated with Illumina Corporation. His work includes a patented approach that applies machine learning to predict outcomes in genotyping processes.

Latest Patents

Martins is named on one patent, titled “Machine learning-based genotyping process outcome prediction using aggregate metrics.” The disclosed method analyzes images of beads arranged in tiles on a beadchip. It calculates average full width at half maximum (FWHM) values for bead images across image channels, then uses those aggregate measurements to predict the likelihood that a sample evaluation run will fail. A trained classifier may generate the failure-likelihood score, which the system reports to help avoid unnecessary post-processing.

Career Highlights

Martins’s patent reflects an application of machine learning to sample evaluation and image-based genotyping workflows. By predicting potential run failures from aggregate image metrics, the approach is designed to support more efficient processing.

Collaborations

The provided information identifies Martin Detelinov Martchovsky and Naghmeh Rezaei as Martins’s coworkers at Illumina Corporation.

Conclusion

Guilherme Medeiros Martins’s patented work combines beadchip image analysis and machine learning to predict genotyping process outcomes and help streamline sample evaluation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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