This inventor holds 2 USPTO granted patents. Top assignee: Infineon Technologies Ag. Active years: 2013-2016.
Company Filing History:
Years Active: 2013-2016
Title: Guenter Holl: Innovator in Semiconductor Technology
Introduction
Guenter Holl is a notable inventor based in Landskron, Austria. He has made significant contributions to the field of semiconductor technology, holding a total of 2 patents. His work focuses on methods for detecting damage to semiconductor chips, which is crucial for ensuring the reliability and performance of electronic devices.
Latest Patents
Guenter Holl's latest patents include a method for detecting damage to a semiconductor chip. This invention involves a semiconductor chip that has a current source coupled between a first potential and an electrical node. The detection circuit has an input coupled to the electrical node, and a first active component is coupled in series with the current source. This component is further coupled between the electrical node and a second potential, with the first active component connected to the electrical node via a first conductive interconnect. Another patent focuses on a detection circuit and method for detecting damage to a semiconductor chip, utilizing similar principles to enhance the reliability of semiconductor devices.
Career Highlights
Guenter Holl is currently employed at Infineon Technologies AG, a leading company in semiconductor solutions. His work at Infineon has allowed him to develop innovative technologies that contribute to the advancement of the semiconductor industry.
Collaborations
Throughout his career, Guenter has collaborated with notable colleagues such as Andreas Tschmelitsch and Gerhard Zojer. These collaborations have fostered an environment of innovation and have led to the development of cutting-edge technologies in the semiconductor field.
Conclusion
Guenter Holl's contributions to semiconductor technology through his patents and work at Infineon Technologies AG highlight his role as an influential inventor in the industry. His innovative methods for detecting damage to semiconductor chips are essential for the ongoing advancement of electronic devices.