Anyang, South Korea

Gu Yong Kim

This inventor holds 1 USPTO granted patent. Top assignee: Huvitz Co., Ltd.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Gu Yong Kim. Retrieved from https://idiyas.com/inventor/gu-yong-kim

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Gu Yong Kim: Innovator in Retinal Imaging Technology

Introduction

Gu Yong Kim is a notable inventor based in Anyang, South Korea. He has made significant contributions to the field of optical coherence tomography (OCT) through his innovative methods for measuring retinal layers. His work is particularly relevant in the medical imaging sector, where precision and accuracy are paramount.

Latest Patents

Gu Yong Kim holds a patent for a method titled "Method for measuring retinal layer in OCT image." This patent describes a comprehensive approach to measuring retinal layers by obtaining an OCT layer image of the retina. The method involves detecting a reference boundary line that indicates a retinal layer, aligning the OCT image, predicting retinal layer regions, and calculating boundary lines to restore the original positions of the retinal layer boundaries.

Career Highlights

Kim is currently associated with Huvitz Co., Ltd., a company known for its advancements in optical technology. His work at Huvitz has allowed him to focus on developing innovative solutions that enhance the capabilities of OCT imaging.

Collaborations

One of his notable collaborators is Hyoung Uk Kim, with whom he has worked closely to advance their research and development efforts in retinal imaging technology.

Conclusion

Gu Yong Kim's contributions to the field of retinal imaging through his patented methods demonstrate his commitment to innovation and excellence. His work continues to impact the medical imaging industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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