Burnaby, Canada

Gregory Lee

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Smt Research Limited. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Gregory Lee. Retrieved from https://idiyas.com/inventor/gregory-lee-5q0678ye

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile



Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Gregory Lee: Innovator in Moisture Monitoring Technology

Introduction: Gregory Lee is an inventor based in Burnaby, Canada. He is currently associated with Smt Research Limited, where he focuses on developing innovative solutions for monitoring moisture in structural components. Although he has not yet been granted any patents, his work is significant in the field of moisture monitoring technology.

Latest Patent Applications: Gregory Lee's notable patent application is titled "Method And System With Multi-Conductor Sensors For Moisture Monitoring Of Structures." This application describes a system and method for monitoring moisture at a structural component that features a membrane for fluid impermeability. The system includes a plurality of sensors that are spaced apart from each other adjacent to the membrane. These sensors include one or more wireless sensors, each equipped with a plurality of sensor conductors. The application outlines a controller that communicates wirelessly with the sensors to determine sensor outputs, focusing on measuring resistance for long-term tracking of pooling electrically conductive fluids on structural components.

Conclusion: Gregory Lee's contributions to moisture monitoring technology highlight his innovative approach to addressing structural integrity issues. His ongoing work at Smt Research Limited promises to advance the field further.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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