Company Filing History:
Years Active: 2004
Title: Gregory Dean Young: Innovator in Test Access Mechanisms
Introduction
Gregory Dean Young is a notable inventor based in Georgetown, TX (US). He has made significant contributions to the field of test access mechanisms, particularly in the context of built-in self-test circuits. His innovative approach has led to the development of a unique patent that enhances testing efficiency in electronic circuits.
Latest Patents
Young holds a patent titled "Test access mechanism for supporting a configurable built-in self-test circuit and method thereof." This invention features a configurable test access mechanism that includes a sliced input wrapper, output wrapper, and scan configuration wrapper connected to a circuit under test. The input wrapper integrates a pseudo-random pattern generator (PRPG) function into a scan test structure without compromising speed and power requirements. Additionally, the output wrapper incorporates a multiple input signature register (MISR) functionality, which is essential for implementing a built-in self-test (BIST) apparatus. By utilizing existing scan structures for the PRPG and MISR functions, Young's invention achieves significant savings in circuitry. The variability of test polynomials can be easily programmed by the user, enhancing the flexibility of the testing process.
Career Highlights
Gregory Dean Young is associated with Motorola Corporation, where he has applied his expertise in developing advanced testing solutions. His work has contributed to the efficiency and reliability of electronic devices, making a lasting impact in the industry.
Collaborations
Young has collaborated with notable colleagues, including Bahram Pouya and Alfred Larry Crouch. Their combined efforts have fostered innovation and advancement in the field of electronic testing.
Conclusion
Gregory Dean Young's contributions to test access mechanisms exemplify the importance of innovation in technology. His patent reflects a commitment to enhancing testing efficiency and reliability in electronic circuits. Young's work continues to influence the industry and inspire future advancements.