Oakville, CT, United States of America

Gregory Cyr

This inventor holds 1 USPTO granted patent. Top assignee: Stanley Black & Decker, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Gregory Cyr. Retrieved from https://idiyas.com/inventor/gregory-cyr

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Gregory Cyr and His Retractable Tape Measure Innovation.

Introduction

Gregory Cyr is an inventor associated with Oakville, Connecticut, and Stanley Black & Decker, Inc. His patent work includes an improvement to the presentation of a retractable tape measure blade.

Latest Patents

Cyr is credited with 1 patent, titled “Tape Measure with Pop Out Blade Presentation.” The invention describes a retractable rule assembly with a housing, a reel, an elongated measuring blade, a distal-end hook, and a coil spring that retracts the blade. It also includes a manually operated blade advancer that engages the blade and/or reel, allowing the user to move the blade outward against the spring’s bias. This mechanism is designed to make the blade easier to advance from the housing.

Career Highlights

Cyr’s listed patent reflects work on a practical improvement to a familiar measuring tool. The blade-advancing mechanism provides an alternative to pulling the blade outward by hand, while the coil spring retains its role in winding the blade back into the housing.

Collaborations

Cyr is associated with Stanley Black & Decker, Inc. His listed coworkers include Joshua P. Schafer and Somen Rajkumar Jaiswal.

Conclusion

Gregory Cyr’s patent focuses on a user-operated mechanism for advancing a retractable tape measure blade, highlighting his contribution to the design of everyday measuring tools.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…