This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Infineon Technologies Ag. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Gregor Bernhard Pobegen: Inventor in Electron Microscopy-Based Sample Analysis.
Introduction
Gregor Bernhard Pobegen is an inventor associated with Villach, Austria, and Infineon Technologies AG. His patent work concerns using scanning electron microscopy to analyze the electrical and material properties of samples.
Latest Patents
Pobegen is associated with 1 patent, titled “Scanning Electron Microscopy-Based Sample Analysis.” The invention describes determining sample information by measuring electrons at two different sample temperatures. Comparing the measurements can help determine properties such as dopant concentration, electric-field strength, defect concentration, Fermi level, and the presence of a space-charge region.
Career Highlights
Pobegen’s listed invention applies electron microscopy to the analysis of semiconductor samples. The method uses temperature-dependent electron measurements to derive information about a sample’s characteristics.
Collaborations
Pobegen’s listed coworkers include Maximilian Alexander Moser and Michael Nelhiebel. His company affiliation is Infineon Technologies AG.
Conclusion
Gregor Bernhard Pobegen’s patent highlights a temperature-dependent electron microscopy method for assessing semiconductor properties and sample characteristics.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile