Greg W Forbes

Title: The Innovations of Greg W Forbes

Introduction

Greg W Forbes is an accomplished inventor based in Sydney, Australia. He has made significant contributions to the field of metrology, particularly in the measurement of aspheric surfaces. With a total of four patents to his name, Forbes has developed innovative methods that enhance the accuracy and efficiency of optical measurements.

Latest Patents

Among his latest patents is the "Stitching of near-nulled subaperture measurements." This metrology system is designed for measuring aspheric test objects through a process of subaperture stitching. It utilizes a wavefront-measuring gauge with a limited capture range to collect partially overlapping subaperture measurements. A variable optical aberrator is employed to reshape the measurement wavefront, ensuring it remains within the gauge's capture range. Additionally, various error compensators are integrated into the stitching operation to manage residual errors associated with the variable optical aberrator.

Another notable patent is the "Method for accurate high-resolution measurements of aspheric surfaces." This system comprises multiple methods for measuring surfaces or wavefronts from a test part, significantly improving accuracy, especially for higher spatial frequencies on aspheres. The methods involve multiple measurements and include calibration and control of the focusing components of a metrology gauge. This approach prevents loss of resolution and accuracy when repositioning the test part. Other methods extend conventional averaging techniques to suppress higher spatial-frequency structures, allowing for better disambiguation of the gauge's inherent bias.

Career Highlights

Greg W Forbes has worked with notable companies such as QED Technologies International, Inc. and QED Technologies, Inc. His experience in these organizations has contributed to his expertise in optical measurement technologies.

Collaborations

Throughout his career, Forbes has collaborated with professionals like Paul Murphy and Jon Fleig. These partnerships have fostered innovation and the development of advanced measurement techniques.

Conclusion

Greg W Forbes is a prominent inventor whose work in metrology has led to significant advancements in the measurement of aspheric surfaces. His innovative patents and collaborations highlight his commitment to improving optical measurement technologies.