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For the Inventor, By the Inventor

Pleasanton, CA, United States of America

Greg Eilenstine

This inventor holds 3 USPTO granted patents. Top assignee: Lam Research Corporation. Active years: 2012-2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Greg Eilenstine. Retrieved from https://idiyas.com/inventor/greg-eilenstine

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 3

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 2

Forward Citations = 5(Granted Patents)


Company Filing History:

goldMedal3 out of 3,945 
 
Lam Research Corporation
 patents

Years Active: 2012-2017

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3 patents (USPTO):Explore Patents
1. 9659757 - Measuring and controlling wafer potential in pulsed RF bias processing (2017-05-23),
2. 8303763 - Measuring and controlling wafer potential in pulsed RF bias processing (2012-11-06),
3. 8192576 - Methods of and apparatus for measuring and controlling wafer potential in pulsed RF bias processing (2012-06-05),

Title: The Inventor Profile of Greg Eilenstine

Introduction: Greg Eilenstine is a talented inventor based in Pleasanton, California, known for his innovative contributions to various industries.

Latest Patents: Greg Eilenstine holds several patents in the fields of technology and consumer products, showcasing his dedication to creating novel solutions.

Career Highlights: With a background in engineering, Greg Eilenstine has a successful career marked by groundbreaking inventions that have made a significant impact on the market.

Collaborations: Throughout his career, Greg Eilenstine has collaborated with leading companies and research institutions to bring his inventions to life, demonstrating his ability to work effectively in multidisciplinary teams.

Conclusion: Greg Eilenstine's passion for innovation and his commitment to pushing the boundaries of what is possible make him a standout figure in the world of inventors.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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