St. Louis, MO, United States of America

Graham P A Bloy

This inventor holds 2 USPTO granted patents. Top assignee: Rf Controls, LLC. Active years: 2012-2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Graham P A Bloy. Retrieved from https://idiyas.com/inventor/graham-p-a-bloy

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 2

Forward Citations = 38(Granted Patents)


Company Filing History:


Years Active: 2012-2013

Loading Chart...
2 patents (USPTO):Explore Patents

Title: Innovations of Graham P A Bloy

Introduction

Graham P A Bloy is an accomplished inventor based in St. Louis, MO (US). He has made significant contributions to the field of RFID technology, holding two patents that showcase his innovative approach to location systems.

Latest Patents

His latest patents include a "Phase Ranging RFID Location System" and "Methods for Noise Validated Phase Ranging RFID Location." The first patent describes a method and apparatus for determining the distance an RFID tag is from an RFID location system antenna. This is achieved by analyzing phase readings from data sets obtained from monitoring reply signals at multiple frequencies. The second patent focuses on validating the distance output of a phase ranging RFID location system, ensuring accuracy through theoretical comparisons and statistical analysis.

Career Highlights

Graham works at Rf Controls, LLC, where he applies his expertise in RFID technology. His work has contributed to advancements in location systems, enhancing their reliability and effectiveness in various applications.

Collaborations

Graham collaborates with Russell Hofer, leveraging their combined knowledge to push the boundaries of RFID technology.

Conclusion

Graham P A Bloy is a notable inventor whose work in RFID technology has led to significant advancements in location systems. His patents reflect a commitment to innovation and accuracy in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…