Company Filing History:
Years Active: 1998
Title: Gordon M. Shedd: Innovator in Scanned-Probe Microscopy
Introduction
Gordon M. Shedd is a notable inventor based in Honeoye Falls, NY (US). He has made significant contributions to the field of scanned-probe microscopy, holding two patents that enhance the functionality and precision of these devices.
Latest Patents
Gordon M. Shedd's latest patents include a support device and stage assembly for a scanned-probe microscope. This innovative support device features a horizontal base member and a vertical bridge member that are transverse to one another. The design allows for the attachment of a scanned-probe microscope to the vertical bridge member, providing a stable platform for conducting experiments. Additionally, the microscope stage assembly includes a readily separable sample plate, facilitating ease of use.
Another significant patent is the electrostrictive actuator for a scanned-probe microscope. This device controls the relative movement between the probe tip and the sample surface using two thin-walled cylindrical members made of electrostrictive material. By applying voltages to the electrodes on these members, the actuator enables precise X-Y horizontal and Z-direction vertical movements, enhancing the capabilities of scanned-probe microscopy.
Career Highlights
Gordon M. Shedd has worked at Burleigh Instruments, Inc., where he has contributed to the development of advanced microscopy technologies. His work has been instrumental in improving the accuracy and efficiency of scanned-probe microscopes.
Collaborations
Throughout his career, Gordon has collaborated with notable colleagues, including Kevin J. Owens and David J. Ray. These partnerships have fostered innovation and have led to the successful development of new technologies in the field.
Conclusion
Gordon M. Shedd's contributions to scanned-probe microscopy through his patents and collaborations highlight his role as an influential inventor. His work continues to impact the field, paving the way for future advancements in microscopy technology.
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