Dortmund, Germany

Goekhan Sen

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Wilo Se. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Goekhan Sen. Retrieved from https://idiyas.com/inventor/goekhan-sen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Goekhan Sen: Inventor in Pump Analysis

Introduction

Goekhan Sen is an inventor associated with Dortmund, Germany, and Wilo SE. His patent work addresses methods for analysing pump assemblies through the sound they emit during operation. The available information identifies 1 patent associated with him.

Latest Patents

Sen’s listed patent is titled “Method for analysing the state of a pump assembly and software application, storage medium and analysis device for execution of the method.” It describes a method and related software and analysis equipment for assessing a pump assembly or one of its components, including determining rotational speed or detecting errors.

The method records airborne sound while the pump assembly operates. It compares audio signals captured at the same geometric location but at different distances from the assembly, with the second recording taken closer than the first. This approach provides sound data for analysing the assembly’s operating state.

Career Highlights

The information provided connects Sen’s invention to Wilo SE, a company associated with pump technology. His listed patent focuses on using acoustic measurements and analysis tools to assess pump operation.

Collaborations

Andreas Toews and Alex Schewalje are identified as Sen’s coworkers. The available details do not specify their roles in the patent or the invention.

Conclusion

Goekhan Sen’s listed patent applies acoustic analysis to pump monitoring, using recordings taken at different distances to help assess operating conditions and identify potential errors.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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