Gnowei Zhang

Title: Gnowei Zhang: Innovator in Dual-Energy CT Systems

Introduction

Gnowei Zhang is a prominent inventor based in Beijing, China. He has made significant contributions to the field of medical imaging, particularly in the development of methods for calibrating dual-energy CT systems. His innovative approach addresses critical challenges in image reconstruction and accuracy.

Latest Patents

Gnowei Zhang holds a patent for a "Method for calibrating dual-energy CT system and method of image reconstruction." This invention provides a comprehensive solution for calculating images of atomic number and density of scanned objects, as well as their attenuation coefficient images at any energy level. The method effectively removes the effects of cupping artifacts caused by X-ray beam hardening. The calibration process involves selecting at least two different materials and detecting penetrative rays from dual-energy rays. This results in the creation of a lookup table that correlates different thickness combinations with projection values. The image reconstruction method further enhances the accuracy of the images produced.

Career Highlights

Gnowei Zhang has worked with esteemed institutions, including Tsinghua University and Nuctech Company Limited. His experience in these organizations has allowed him to refine his skills and contribute to advancements in medical imaging technology.

Collaborations

Throughout his career, Gnowei Zhang has collaborated with notable colleagues, including Li Ni Zhang and Zhiqiang Chen. These partnerships have fostered innovation and the sharing of ideas in the field of dual-energy CT systems.

Conclusion

Gnowei Zhang's contributions to the field of medical imaging through his patented methods for dual-energy CT systems highlight his role as an influential inventor. His work not only improves calibration procedures but also enhances the precision of medical imaging technologies.