New York, NY, United States of America

Glyn Johnson

This inventor holds 3 USPTO granted patents. Top assignees: New York University, Columbia University. Active years: 1993-2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Glyn Johnson. Retrieved from https://idiyas.com/inventor/glyn-johnson-dd64i6s5

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 66.7

Average Co-Inventor Count = 3.0

ph-index = 2

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 1993-2010

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3 patents (USPTO):Explore Patents

Title: Glyn Johnson: Inventor in Magnetic Field Measurement

Introduction

Glyn Johnson is an inventor associated with New York, NY (US). His patent work includes methods and systems for measuring magnetic field correlation, a technique relevant to analyzing magnetic-field behavior.

Latest Patents

Johnson’s listed patents include “Method, system and software arrangement for measuring magnetic field correlation” and “Method, system and software arrangement, for measuring magnetic field correlation.” Both describe approaches for measuring the magnetic field correlation function (MFC) using asymmetric spin echoes. The methods may use Asymmetric Dual Spin Echo Sequences (ADSE) or Echo Planar Imaging Asymmetric Dual Spin Echo Sequences (EPI-ADSE) to apply multiple echoes to a sample and collect data for determining the MFC. Johnson is credited with 3 patents.

Career Highlights

The provided career information associates Johnson with New York University and Columbia University. These institutions are noted here as organizations where he worked.

Collaborations

Johnson’s listed coworkers include Jens Jensen and Ramesh Chandra.

Conclusion

Glyn Johnson’s patent portfolio includes techniques for measuring magnetic field correlation through asymmetric spin-echo sequences, alongside career associations with New York University and Columbia University.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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