Glenn M Kramer

Title: Glenn M Kramer: Innovator in Integrated Circuit Testing

Introduction

Glenn M Kramer is a notable inventor based in Vista, CA (US). He has made significant contributions to the field of integrated circuit testing, particularly through his innovative patent that enhances the efficiency of identifying defective parts in digital circuits.

Latest Patents

Kramer's most recent patent is titled "Method of utilizing IDDQ tests to screen out defective parts." This invention employs effective widths of NMOS and PMOS devices in a digital circuit, along with their intrinsic junction and subthreshold leakage currents. The method produces a specification for IDDQ, which includes the range of IDDQ and the delta of IDDQ between pre- and post-overvoltage stress tests. This process effectively screens out defective integrated circuits that exhibit excessive extrinsic current leakage. The computer-implemented method generates an indication of whether the IDDQ values associated with tested integrated circuits fall within the IDDQ specification, thereby eliminating the need for time-intensive and costly burn-in testing.

Career Highlights

Glenn M Kramer is currently associated with Raytheon Company, where he applies his expertise in integrated circuit technology. His work has been instrumental in advancing testing methodologies that improve the reliability of electronic components.

Collaborations

Kramer has collaborated with notable colleagues, including Emad S Zawaideh and Truc Q Vu, who have contributed to his projects and innovations in the field.

Conclusion

Glenn M Kramer is a distinguished inventor whose work in integrated circuit testing has led to significant advancements in the industry. His innovative methods not only enhance testing efficiency but also reduce costs associated with traditional testing processes.