Berwyn, PA, United States of America

Glenn D Williams

This inventor holds 1 USPTO granted patent. Top assignee: Betz Laboratories, Inc.. Active years: 1979.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Glenn D Williams. Retrieved from https://idiyas.com/inventor/glenn-d-williams-tj8irvsd

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 1979

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1 patent (USPTO):Explore Patents

Title: Glenn D Williams - Innovator in Blast Furnace Technology

Introduction

Glenn D Williams is a notable inventor based in Berwyn, PA (US). He has made significant contributions to the field of blast furnace technology. His innovative approach has led to the development of methods that enhance the efficiency and control of blast furnace operations.

Latest Patents

Williams holds a patent for "Blast furnace testing and control methods." This patent describes a method for evaluating and controlling blast furnace operations by measuring the carbon content of off-gases at a test point located downstream of the wet scrubber. This innovation is crucial for improving the operational efficiency of blast furnaces.

Career Highlights

Glenn D Williams is associated with Betz Laboratories, Inc., where he applies his expertise in furnace technology. His work has been instrumental in advancing the methods used in industrial applications related to blast furnaces.

Collaborations

Williams has collaborated with Terrence W Mattioli, contributing to the development of innovative solutions in their field. Their partnership has fostered advancements in blast furnace technology.

Conclusion

Glenn D Williams is a key figure in the innovation of blast furnace testing and control methods. His contributions have significantly impacted the industry, showcasing the importance of continuous improvement in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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