Anderson, SC, United States of America

Glendon C Smith

This inventor holds 1 USPTO granted patent. Top assignee: Badische Corporation. Active years: 1986.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Glendon C Smith. Retrieved from https://idiyas.com/inventor/glendon-c-smith

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 1986

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1 patent (USPTO):Explore Patents

Title: Glendon C. Smith: Innovator in Tension Measurement Technology

Introduction

Glendon C. Smith is a notable inventor based in Anderson, SC (US). He has made significant contributions to the field of measurement technology, particularly with his innovative tension measurement device. His work exemplifies the intersection of simplicity and durability in engineering design.

Latest Patents

Smith holds a patent for a tension measurement device, which is characterized by its four-sided design and parallelogram configuration. This device incorporates a two-part position sensor, preferably a Hall-Effect device, and utilizes two deformable, resilient connecting members, which are ideally leaf springs. The design is exceptionally simple yet durable, showcasing Smith's ingenuity in creating effective measurement solutions.

Career Highlights

Glendon C. Smith is associated with Badische Corporation, where he applies his expertise in developing innovative measurement devices. His career reflects a commitment to advancing technology in practical applications, making him a valuable asset to his organization.

Conclusion

Glendon C. Smith's contributions to tension measurement technology highlight his innovative spirit and dedication to engineering excellence. His patent serves as a testament to his ability to create effective and reliable solutions in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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