This inventor holds 1 USPTO granted patent. Top assignee: Atmel Corporation. Active years: 2004.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2004
Title: Gladwyn O D'Souza: Innovator in Integrated Circuit Testing
Introduction
Gladwyn O D'Souza is a notable inventor based in Los Gatos, California. He has made significant contributions to the field of integrated circuits, particularly in the area of signal propagation measurement. His innovative approach has led to the development of a unique test circuit that enhances the accuracy of speed measurements in integrated circuits.
Latest Patents
Gladwyn O D'Souza holds a patent for a "Test circuit for input-to-output speed measurement." This invention aids in accurately measuring the input pin to output pin signal propagation speed through an integrated circuit. The test circuit incorporates a D flip-flop in the signal path near the output pad to register the arrival of a test signal transition. The flip-flop is clocked at various frequencies, allowing for precise measurements of signal delays.
Career Highlights
Gladwyn O D'Souza is currently employed at Atmel Corporation, where he continues to work on advancements in integrated circuit technology. His expertise in the field has made him a valuable asset to the company. He has collaborated with other talented professionals, including his coworker Oliver Chihkuang Kao, to drive innovation in their projects.
Collaborations
Due to space constraints, the details of collaborations will not be included.
Conclusion
Gladwyn O D'Souza's contributions to integrated circuit testing exemplify the spirit of innovation in technology. His patent and work at Atmel Corporation highlight his commitment to advancing the field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile