Giwon Shin

Title: Giwon Shin: Innovator in Tumor Mutation Detection

Introduction

Giwon Shin is a prominent inventor based in Stanford, California. He has made significant contributions to the field of genomic research, particularly in the detection of tumor mutations. With a total of 2 patents, his work is paving the way for advancements in cancer diagnostics.

Latest Patents

Giwon Shin's latest patents include a method for determining if a tumor has a mutation in a microsatellite. This innovative method involves isolating genomic DNA from both tumor and non-tumor samples from the same patient. The process includes sequencing a plurality of microsatellite loci and comparing the results to identify mutations. Another notable patent is focused on high-resolution short tandem repeat (STR) analysis using next-generation sequencing. This method allows for the detailed analysis of STRs by selectively amplifying strands of DNA and counting the number of STR repeats in sequence reads.

Career Highlights

Giwon Shin is affiliated with Leland Stanford Junior University, where he conducts his research and develops his innovative methods. His work has garnered attention for its potential impact on cancer treatment and diagnostics.

Collaborations

Some of his notable coworkers include Hanlee P Ji and Billy Tsz Cheong Lau, who contribute to the collaborative research efforts at the university.

Conclusion

Giwon Shin's contributions to the field of genomic research are significant, particularly in the area of tumor mutation detection. His innovative methods and patents are set to enhance cancer diagnostics and treatment options.