Vercelli, Italy

Giovanni Tomasino

This inventor holds 1 USPTO granted patent. Top assignee: Gm Global Technolgoy Operations, Inc.. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Giovanni Tomasino. Retrieved from https://idiyas.com/inventor/giovanni-tomasino

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: Giovanni Tomasino: Inventor in Component Fault Analysis

Introduction

Giovanni Tomasino is an inventor based in Vercelli, Italy. His patent work focuses on using digital images to help identify component faults and find relevant remedial actions.

Latest Patents

Tomasino is associated with 1 patent: “Image Identification and Retrieval for Component Fault Analysis.” The invention describes a method that builds a database of images showing previously analyzed component faults, along with the corresponding remedial actions. When a new fault occurs, its image is compared with the stored images using a computed target characteristic. The system ranks the stored images according to how closely their characteristics correspond to the new image, then presents the results to help users identify a similar known fault and its remedy.

Career Highlights

Tomasino is associated with GM Global Technology Operations, Inc. His patent reflects an application of image-based retrieval to component troubleshooting, helping connect visual evidence of a fault with previously identified problems and corrective actions.

Collaborations

His listed coworkers include Alessandra Neri and Daniele Gionta. The available information identifies them as coworkers but does not specify their roles in the patent.

Conclusion

Giovanni Tomasino’s patent work applies image comparison and retrieval to component fault analysis, supporting the identification of known faults and their corresponding remedies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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