Singapore, Singapore

Giovanni Ferrara

This inventor holds 1 USPTO granted patent. Top assignee: Infineon Technologies Austria Ag. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Giovanni Ferrara. Retrieved from https://idiyas.com/inventor/giovanni-ferrara-xew1mdxb

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Giovanni Ferrara: Innovator in Semiconductor Technology

Introduction

Giovanni Ferrara is a prominent inventor based in Singapore, known for his contributions to semiconductor technology. With a focus on defect detection and localization in semiconductor chips, Ferrara has made significant strides in enhancing the reliability and efficiency of these critical devices.

Latest Patents

Ferrara holds a patent for "Integrated defect detection and location systems and methods in semiconductor chip devices." This innovative patent describes systems and methods for detecting and localizing defects in semiconductor chips. The invention features a plurality of registers arranged within a semiconductor chip, which can vary in number based on the desired level of localization. These registers are geometrically distributed to ensure effective defect detection across the entire chip area or specific regions, such as the central active area. The system allows for defect detection routines to operate in parallel with normal chip functions, providing a fast and efficient solution for identifying issues during power-up or other phases. The multifunctional nature of the registers enables them to serve operational functions when not engaged in defect detection, thereby enhancing the overall performance of the chip.

Career Highlights

Ferrara's career is marked by his work at Infineon Technologies Austria AG, where he has contributed to advancing semiconductor technologies. His expertise in defect detection systems has positioned him as a key player in the field, driving innovation and improving product reliability.

Collaborations

Ferrara collaborates with Cheow Guan Lim, working together to push the boundaries of semiconductor technology and enhance the capabilities of their inventions.

Conclusion

Giovanni Ferrara's innovative work in semiconductor defect detection systems exemplifies the importance of advancements in technology. His contributions continue to shape the future of semiconductor devices, ensuring greater reliability and efficiency in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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