Genoa, Italy

Giovanni Bini

This inventor holds 3 USPTO granted patents and 2 EPO patents. Top assignee: Esaote S.p.a.. Active years: 2019-2023.


% Patents Active = 100.0


Average Co-Inventor Count = 1.3

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2019-2023

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3 patents (USPTO):Explore Patents

Title: Giovanni Bini: Innovator in Ultrasound Technology

Introduction

Giovanni Bini is a prominent inventor based in Genoa, Italy. He has made significant contributions to the field of ultrasound technology, particularly in the area of shear wave elasticity imaging. With a total of 3 patents to his name, Bini continues to push the boundaries of medical imaging.

Latest Patents

One of Giovanni Bini's latest patents is a method and ultrasound system for shear wave elasticity imaging. This innovative method involves several steps, including acquiring B-mode ultrasound images of a target region in a body, selecting a region of interest, and transmitting a shear wave excitation pulse. The process also includes measuring displacements of tracking focal points at different depths and determining elasticity parameters based on these displacements. The final steps involve modifying the appearance of pixels in the B-mode image according to the elasticity parameters and displaying the modified pixels.

Career Highlights

Giovanni Bini is associated with Esaote S.p.A., a company known for its advancements in medical imaging technology. His work has been instrumental in developing new methods that enhance the accuracy and effectiveness of ultrasound imaging.

Collaborations

Throughout his career, Giovanni Bini has collaborated with notable colleagues, including Antonio Questa and Davide Carlini. These partnerships have contributed to the success of his innovative projects and patents.

Conclusion

Giovanni Bini's contributions to ultrasound technology exemplify the impact of innovation in medical imaging. His work continues to influence the field and improve diagnostic capabilities.

Profile summary based on public USPTO records.
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