Seoul, South Korea

Gilcho Ahn

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Display Co., Ltd.. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Gilcho Ahn. Retrieved from https://idiyas.com/inventor/gilcho-ahn

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Gilcho Ahn: Innovator in Touch Sensing Technology

Introduction

Gilcho Ahn is a prominent inventor based in Seoul, South Korea. He is known for his contributions to the field of touch sensing technology. With a focus on innovative solutions, Ahn has made significant strides in enhancing user interaction with electronic devices.

Latest Patents

Ahn holds a patent for a touch sensing system. This system includes a touch sensor with multiple sensing electrodes and a first comparator. The first comparator amplifies the difference between two input ends, which are connected to adjacent and non-adjacent sensing electrodes. This innovative design improves the accuracy and responsiveness of touch interfaces.

Career Highlights

Gilcho Ahn is currently employed at Samsung Display Co., Ltd. His work at this leading technology company has allowed him to develop cutting-edge solutions in display technology. Ahn's expertise in touch sensing systems has positioned him as a key player in the industry.

Collaborations

Ahn collaborates with JeonKyoo Kim, a fellow innovator in the field. Together, they work on advancing touch sensing technologies and exploring new applications for their inventions.

Conclusion

Gilcho Ahn's contributions to touch sensing technology exemplify the spirit of innovation. His patent and work at Samsung Display Co., Ltd. highlight his commitment to enhancing user experiences in electronic devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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