Gilad Laredo

Title: Gilad Laredo: Innovator in Optical Metrology

Introduction

Gilad Laredo is a prominent inventor based in Milpitas, CA, known for his contributions to the field of optical metrology. With a focus on enhancing measurement techniques, Laredo has developed innovative solutions that address the challenges faced in metrology applications.

Latest Patents

Laredo holds a patent for a system titled "Sensitive optical metrology in scanning and static modes." This metrology system is designed to perform measurements in two distinct modes: a static mode, where metrology targets remain stationary, and a scanning mode, where targets are in motion. The system includes a controller that directs the metrology tool to perform measurements based on the designated mode, generating valuable metrology data for the inspected sample. This innovation reflects Laredo's commitment to advancing metrology technology.

Career Highlights

Laredo is currently employed at Kla Corporation, where he continues to push the boundaries of optical metrology. His work has significantly contributed to the development of advanced measurement systems that are crucial for various applications in the industry.

Collaborations

Throughout his career, Laredo has collaborated with notable colleagues, including Andrew V Hill and Amnon Manassen. These partnerships have fostered a collaborative environment that enhances innovation and drives progress in metrology.

Conclusion

Gilad Laredo's contributions to optical metrology exemplify his dedication to innovation and excellence in the field. His patent and ongoing work at Kla Corporation highlight his role as a key figure in advancing measurement technologies.