Mazkeret Batia, Israel

Gilad Erel


Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2018-2019

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2 patents (USPTO):Explore Patents

Title: The Innovations of Gilad Erel

Introduction

Gilad Erel is a notable inventor based in Mazkeret Batia, Israel. He has made significant contributions to the field of charged particle beam technology, holding two patents that showcase his innovative approach to specimen inspection systems. His work is instrumental in advancing the capabilities of inspection technologies.

Latest Patents

Gilad Erel's latest patents include a "Method of operating a charged particle beam specimen inspection system." This patent describes a system that features an emitter for emitting at least one charged particle beam, a specimen support table for supporting the specimen, and an objective lens for focusing the charged particle beam. Additionally, it includes a charge control electrode positioned between the objective lens and the specimen support table, which has at least one aperture opening for the charged particle beam. The system also incorporates a flood gun designed to emit further charged particles for charging the specimen, with a flood gun aperture opening in the charge control electrode. Another patent, titled "Charged particle beam specimen inspection system and method for operation thereof," outlines similar features and functionalities, emphasizing the importance of this technology in specimen inspection.

Career Highlights

Gilad Erel is currently employed at Applied Materials Israel Limited, where he continues to develop and refine technologies related to charged particle beams. His work at this company has positioned him as a key player in the field of materials engineering and inspection systems.

Collaborations

Throughout his career, Gilad has collaborated with talented individuals such as Michal Avinun-Kalish and Stefan Lanio. These collaborations have fostered an environment of innovation and creativity, contributing to the success of their projects.

Conclusion

Gilad Erel's contributions to the field of charged particle beam technology are noteworthy. His patents reflect a deep understanding of the complexities involved in specimen inspection systems. As he continues to innovate at Applied Materials Israel Limited, his work will undoubtedly influence the future of inspection technologies.

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