Herzliya, Israel

Gilad Adler

This inventor holds 1 USPTO granted patent. Top assignee: Inuitive Ltd.. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Gilad Adler. Retrieved from https://idiyas.com/inventor/gilad-adler-cohc9vxp

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Gilad Adler - Innovator in Stereoscopic Technology

Introduction

Gilad Adler is a notable inventor based in Herzliya, Israel. He has made significant contributions to the field of imaging technology, particularly through his innovative patent related to stereoscopic apparatus.

Latest Patents

Adler holds a patent for a "Stereoscopic apparatus and a method for determining exposure time." This invention involves a method and apparatus designed to determine the optimal exposure time for capturing images. The apparatus includes at least one image capturing device that captures pairs of images. A processor within the apparatus calculates a texture-signal-to-noise ratio (TSNR) metric and an image saturation metric based on the captured images. It then determines the appropriate exposure duration for future image captures, ensuring high-quality imaging.

Career Highlights

Gilad Adler is currently associated with Inuitive Ltd., a company that focuses on advanced imaging technologies. His work at Inuitive Ltd. showcases his commitment to enhancing imaging systems and developing innovative solutions in the field.

Collaborations

Adler collaborates with Yaron Rashi, contributing to the advancement of imaging technology through their combined expertise.

Conclusion

Gilad Adler's contributions to stereoscopic technology and his innovative patent demonstrate his significant role in the field of imaging. His work continues to influence advancements in capturing high-quality images.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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