Gil Drachuck

Title: Gil Drachuck: Innovator in Imaging-Based Overlay Measurements

Introduction

Gil Drachuck is a notable inventor based in Hillsboro, OR (US). He has made significant contributions to the field of imaging-based overlay measurements, showcasing his expertise through his innovative patent.

Latest Patents

Drachuck holds a patent titled "System and method for application of harmonic detectivity as a quality indicator for imaging-based overlay measurements." This patent describes an image-based overlay metrology system that includes a controller couplable to a metrology sub-system. The controller is designed to receive a set of image signals from a first metrology target and determine a plurality of harmonic detectivity metric values. By calculating these values, the controller can identify a set of optical measurement conditions, which define a recipe for optical metrology measurements. This recipe is then provided to the metrology sub-system for executing measurements on additional metrology targets. Drachuck's innovative approach enhances the accuracy and efficiency of overlay measurements in imaging systems.

Career Highlights

Gil Drachuck is associated with Kla Corporation, where he applies his expertise in metrology and imaging technologies. His work at Kla Corporation has positioned him as a key player in advancing measurement systems that are critical for various applications in the industry.

Collaborations

Drachuck has collaborated with notable colleagues such as Tom Leviant and David Gready. These collaborations have contributed to the development of innovative solutions in the field of imaging and metrology.

Conclusion

Gil Drachuck's contributions to imaging-based overlay measurements through his patent and work at Kla Corporation highlight his role as an influential inventor in the field. His innovative solutions continue to impact the industry positively.