Seongnam-si, South Korea

Gihwan Lee

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Yonsei University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Gihwan Lee. Retrieved from https://idiyas.com/inventor/gihwan-lee-8i7q7ikp

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Gihwan Lee: Innovator in 3D Model Reconstruction

Introduction

Gihwan Lee is a notable inventor based in Seongnam-si, South Korea. He has made significant contributions to the field of 3D model reconstruction through his innovative methods and devices. His work focuses on enhancing the learning processes involved in creating accurate three-dimensional models.

Latest Patents

Gihwan Lee holds a patent for a "Method and device for learning 3D model reconstruction." This patent describes a learning method that utilizes at least one processor to extract points related to an object from a learning image. The process involves obtaining a gradient map that includes surrounding context information in three dimensions, determining the weight of the point based on the learning image and gradient map, and ultimately learning the 3D reconstruction model. This innovative approach allows for the output of a 3D model of the object from the reconstruction model when the learning image is inputted. He has 1 patent to his name.

Career Highlights

Gihwan Lee is affiliated with Yonsei University, where he contributes to research and development in the field of 3D modeling and reconstruction. His academic background and ongoing research efforts have positioned him as a key figure in advancing technology in this area.

Conclusion

Gihwan Lee's work in 3D model reconstruction showcases his innovative spirit and dedication to enhancing technological processes. His contributions are paving the way for future advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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