King Williamstown, South Africa

Gideon Fourie

This inventor holds 1 USPTO granted patent. Top assignee: South African Inventions Development Corporation. Active years: 1986.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Gideon Fourie. Retrieved from https://idiyas.com/inventor/gideon-fourie

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 1986

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1 patent (USPTO):Explore Patents

Title: Gideon Fourie: Innovator in Pallet Design

Introduction

Gideon Fourie is a notable inventor based in King Williamstown, South Africa. He has made significant contributions to the field of pallet design, showcasing his innovative spirit through his patented invention.

Latest Patents

Gideon Fourie holds a patent for a "Pallet with tensioned strips and bulk bin." This invention features a pallet comprising a top deck made of planks, to which blocks are secured. The pallet is designed to deform into a convex shape, reducing its length and width compared to its undeformed dimensions. The lower faces of the blocks are connected by tensioned strip material, which lies flat on the floor, allowing for easy access by forklift tines when lifting the pallet.

Career Highlights

Gideon is associated with the South African Inventions Development Corporation, where he continues to develop and refine his innovative ideas. His work has contributed to advancements in pallet technology, enhancing efficiency in material handling.

Collaborations

Gideon collaborates with David E Muir, working together to push the boundaries of invention and improve existing technologies.

Conclusion

Gideon Fourie's contributions to pallet design exemplify the spirit of innovation. His patented invention not only showcases his creativity but also addresses practical challenges in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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