Gan-Yavne, Israel

Gideon Amir

This inventor holds 1 USPTO granted patent. Top assignee: Indigo N.v.. Active years: 2001.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Gideon Amir. Retrieved from https://idiyas.com/inventor/gideon-amir-9dx1ee6p

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2001

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1 patent (USPTO):Explore Patents

Title: The Innovations of Gideon Amir

Introduction

Gideon Amir is a notable inventor based in Gan-Vavne, Israel. He has made significant contributions to the field of technology, particularly in the area of printing solutions. His innovative work has led to the development of a unique patent that enhances the efficiency of laser printers.

Latest Patents

Gideon Amir holds a patent for a "High duty cycle scanner for laser printer." This invention is designed to improve the performance and reliability of laser printing technology. With 1 patent to his name, Amir's work exemplifies the spirit of innovation in the printing industry.

Career Highlights

Gideon Amir is currently employed at Indigo N.V., a company known for its advancements in digital printing technology. His role at Indigo has allowed him to further explore and develop his ideas, contributing to the company's reputation as a leader in the field.

Collaborations

Throughout his career, Amir has collaborated with talented individuals such as Michael Plotkin and Haim Livne. These partnerships have fostered a creative environment that encourages the exchange of ideas and the development of groundbreaking technologies.

Conclusion

Gideon Amir's contributions to the field of printing technology highlight his innovative spirit and dedication to improving laser printing solutions. His patent and collaborations reflect a commitment to advancing the industry and enhancing user experiences.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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