This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 1981.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1981
Title: Geunter Makosch: Innovator in Interferometric Measurement
Introduction
Geunter Makosch is a notable inventor based in Sindelfingen, Germany. He has made significant contributions to the field of measurement technology, particularly through his innovative patent in interferometric measuring methods. His work has implications for various applications in precision measurement.
Latest Patents
Geunter Makosch holds a patent for an interferometric measuring method. This method involves directing two radiation components, which differ in their state of polarization or wavelength, onto closely adjacent points of the object to be measured. The reflected components are then recombined and fed to a phase shifter that periodically shifts the phase positions of the two components. This innovative approach allows for the compensation of phase shifts caused by the object being measured, enabling precise height measurements and surface slope analysis.
Career Highlights
Geunter Makosch is associated with the International Business Machines Corporation (IBM), where he has contributed to advancements in measurement technologies. His expertise in interferometry has positioned him as a key figure in the development of innovative measurement solutions.
Collaborations
Geunter has worked alongside Bernhard Solf, collaborating on various projects that leverage their combined expertise in measurement technology. Their partnership has fostered advancements in the field, enhancing the capabilities of measurement systems.
Conclusion
Geunter Makosch's contributions to interferometric measurement methods exemplify the impact of innovation in technology. His work continues to influence the field, paving the way for future advancements in precision measurement.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
