Geun Haeng Lee

Title: Innovations of Geun Haeng Lee

Introduction

Geun Haeng Lee is a notable inventor based in Seoul, South Korea. He has made significant contributions to the field of distance measurement technology. With a total of two patents to his name, his work reflects a commitment to advancing innovative solutions.

Latest Patents

Geun Haeng Lee's latest patents include a distance measuring apparatus and an impulse IQ signal mismatch calibration apparatus. The distance measuring apparatus features a digital-to-time converter (DTC) that receives a clock signal and outputs a pulse corresponding to a provided code. It includes an in-phase (I) template generation part and a quadrature (Q) template generation part, both triggered by the pulse output from the DTC. These components work together to perform demodulation with signals reflecting off a target, ultimately converting the result into a digital code to measure the distance to that target. His second patent discloses a modulation method for modulating n-bit data, which involves forming a time difference between a data impulse and a sync impulse, modulating the amplitude of the sync impulse, and combining both impulses.

Career Highlights

Geun Haeng Lee is affiliated with Yonsei University, where he continues to engage in research and development. His work at the university allows him to explore innovative technologies and contribute to academic advancements in his field.

Collaborations

He collaborates with notable colleagues such as Tae Wook Kim and Min Jae Yoo, enhancing the scope and impact of his research endeavors.

Conclusion

Geun Haeng Lee's contributions to distance measurement technology and modulation methods showcase his innovative spirit and dedication to advancing the field. His patents reflect a blend of technical expertise and practical application, making him a significant figure in the realm of inventions.