Renkum, Netherlands

Gerrit Dijkstra

This inventor holds 1 USPTO granted patent. Top assignee: Nxp B.v.. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Gerrit Dijkstra. Retrieved from https://idiyas.com/inventor/gerrit-dijkstra-fa22m806

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Gerrit Dijkstra and Current-Sensing Innovation

Introduction

Gerrit Dijkstra is an inventor associated with NXP B.V. and based in Renkum, the Netherlands. His patent work includes an invention for sensing output current in a switching amplifier.

Latest Patents

Dijkstra is credited with 1 patent, titled “Current Sensing.” The patent describes a switching amplifier with two series-connected switching transistors, a driver that controls them using pulse-width modulation (PWM) signals, and an output connection for driving a load. Its current-sensing circuit uses a resistor between one transistor and a supply line, while a voltage-sense circuit measures the voltage across that resistor. The circuit samples the voltage at the midpoint of successive corresponding portions of a PWM signal, providing a method for measuring current through the output load.

Career Highlights

Dijkstra’s listed patent reflects work on amplifier circuitry and the measurement of output current. The described sampling approach connects current sensing to the timing of the amplifier’s PWM operation.

Collaborations

Dijkstra is associated with NXP B.V. His listed coworker is Lutsen Ludgerus Albertus Hendrikus Dooper.

Conclusion

Gerrit Dijkstra’s patent documents a switching-amplifier current-sensing design that samples resistor voltage in coordination with PWM timing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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