Tucker, GA, United States of America

German Capuano

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Ncr Voyix Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: German Capuano. Retrieved from https://idiyas.com/inventor/german-capuano

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: German Capuano and Item Type Identification for Checkout Verification.

Introduction

German Capuano is an inventor associated with Tucker, Georgia, and NCR Voyix Corporation. His patent work addresses checkout verification by using machine learning to help identify items during a transaction.

Latest Patents

Capuano is named on 1 patent: “Item Type Identification for Checkout Verification.” The invention describes a checkout process in which a terminal operator identifies an item as produce, and an image of the item is analyzed by a machine-learning model. The model determines whether the item is produce or a consumer packaged good (CPG). If it identifies the item as a CPG item, the transaction is suspended so the item can be audited.

Career Highlights

Capuano’s documented patent contribution focuses on applying image analysis and machine learning to retail checkout controls. The system is designed to flag potential mismatches between an operator’s item classification and the model’s determination.

Collaborations

Capuano’s listed coworker is Matthew K. Farrow. The available information identifies both as connected to the patent record but does not specify their individual roles in developing the invention.

Conclusion

German Capuano’s patent describes a machine-learning approach to checkout verification that can prompt an audit when an item’s classification appears inconsistent.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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