This inventor holds 2 USPTO granted patents and 1 EPO patent. Top assignees: Midwest Instrument Co., Inc., Minkon Gmbh. Active years: 2002-2019.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2002-2019
Title: Gerhard Wünsch: Innovator in Optical Temperature Measurement
Introduction
Gerhard Wünsch is a notable inventor based in Mettmann, Germany. He has made significant contributions to the field of optical temperature measurement, particularly in the context of molten metals. His innovative approach has led to the development of a unique method that enhances the accuracy of temperature determination in industrial applications.
Latest Patents
Gerhard Wünsch holds a patent for a "Method for optically determining the temperature of a molten metal, and reeling device for carrying out said method." This invention involves a sophisticated measuring device that includes a calibration system for a replacement measuring chain. The device utilizes an optical waveguide to guide electromagnetic radiation emitted from molten metal to an optical detector. This allows for precise temperature analysis based on the electromagnetic radiation characteristics.
Career Highlights
Wünsch's career is marked by his work at Minkon GmbH, where he has applied his expertise in optical measurement technologies. His innovative methods have not only advanced the field but have also contributed to the efficiency and safety of industrial processes involving molten metals.
Collaborations
Throughout his career, Gerhard Wünsch has collaborated with esteemed colleagues such as Harald Fischer and Torsten Lamp. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.
Conclusion
Gerhard Wünsch's contributions to optical temperature measurement exemplify the impact of innovative thinking in industrial applications. His patent and work at Minkon GmbH highlight the importance of precision in measuring technologies.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile