Trier, Germany

Gerhard Meier

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Tmt Tapping-Measuring-Technology Sarl. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Gerhard Meier. Retrieved from https://idiyas.com/inventor/gerhard-meier-l8qaxz5t

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: Gerhard Meier: Innovator in Drill Bit Technology

Introduction

Gerhard Meier is a notable inventor based in Trier, Germany. He has made significant contributions to the field of drilling technology, particularly with his innovative designs that enhance drilling efficiency and effectiveness.

Latest Patents

Gerhard Meier holds a patent for a drill bit designed specifically for rotary percussive drilling. This drill bit features a drill head that includes at least one hard material insert, which is crucial for creating tap holes in melting furnaces. The design incorporates a unique seat in the axial end face of the drill head, allowing the hard material insert to protrude beyond the end face. This innovative feature ensures a form-fitting connection between the insert and the drill head, enhancing the drill bit's performance.

Career Highlights

Throughout his career, Gerhard Meier has been associated with TMT Tapping-Measuring-Technology Sarl, where he has applied his expertise in drilling technology. His work has focused on developing advanced tools that meet the demands of modern industrial applications.

Collaborations

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Conclusion

Gerhard Meier's contributions to drill bit technology exemplify his innovative spirit and commitment to improving industrial processes. His patent reflects a deep understanding of the challenges faced in drilling applications, making him a valuable figure in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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