Schopfheim, Germany

Gerhard Dittrich

This inventor holds 1 USPTO granted patent, plus 1 CIPO patent and 2 EPO patents. Top assignee: Endress+hauser Gmbh+co.. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Gerhard Dittrich. Retrieved from https://idiyas.com/inventor/gerhard-dittrich

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile




Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: Gerhard Dittrich: Innovator in Measured Value Provision

Introduction

Gerhard Dittrich is a notable inventor based in Schopfheim, Germany. He has made significant contributions to the field of measurement technology, particularly through his innovative patent that enhances the way measured values are provided to end customers.

Latest Patents

Gerhard Dittrich holds a patent titled "Method for providing measured values for end customers." This invention involves a method where a sensor records the measured value for a process variable and transmits it to a process control system. The number of transmission operations is counted based on the number of times the data is sent. The fundamental advantage of this invention is that the end customer pays only for the measured value they require, rather than for the sensor itself. This innovation streamlines costs and improves customer satisfaction.

Career Highlights

Throughout his career, Gerhard Dittrich has worked with prominent companies in the measurement technology sector. Notably, he has been associated with Endress+Hauser GmbH & Co. and Endress + Hauser GmbH & Co. KG. His experience in these organizations has contributed to his expertise and the development of his innovative solutions.

Collaborations

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Conclusion

Gerhard Dittrich's contributions to the field of measurement technology through his innovative patent demonstrate his commitment to improving customer experiences and reducing costs. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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