Hamburg, Germany

Gerd Joachim Eckert

USPTO Granted Patents = 4 

 

Average Co-Inventor Count = 4.1

ph-index = 3

Forward Citations = 62(Granted Patents)


Company Filing History:


Years Active: 2008-2014

Loading Chart...
Loading Chart...
4 patents (USPTO):Explore Patents

Title: Gerd Joachim Eckert: Innovator in Fluorescent Sample Analysis

Introduction

Gerd Joachim Eckert is a notable inventor based in Hamburg, Germany. He has made significant contributions to the field of quantitative real-time analysis of fluorescent samples. With a total of 4 patents to his name, Eckert's work has advanced the methodologies used in photometric investigations.

Latest Patents

Eckert's latest patents include a method and device for the quantitative real-time analysis of fluorescent samples. This innovative method involves exciting each sample to fluoresce using individual light sources. The emitted light intensity is measured, allowing for highly precise measurements, even at low light intensities. The device operates by switching the light sources on and off during defined intervals, optimizing the analysis time. Another significant patent is a device and method for radiometric measurement of multiple samples. This invention allows for the photometric investigation of sample radiations caused by overlapping emitter elements, enabling the detection and evaluation of sample radiation from individual samples.

Career Highlights

Eckert is currently associated with Eppendorf AG, a company known for its innovative solutions in laboratory technology. His work at Eppendorf has been instrumental in developing advanced analytical techniques that enhance research capabilities.

Collaborations

Eckert has collaborated with notable colleagues such as Andreas Schirr and Markus Lapczyna. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Gerd Joachim Eckert's contributions to the field of fluorescent sample analysis exemplify his dedication to innovation. His patents reflect a commitment to improving measurement techniques, which have significant implications for research and development in various scientific fields.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…