The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 2013
Filed:
Aug. 29, 2008
Rainer Treptow, Norderstedt, DE;
Gerd Joachim Eckert, Hamburg, DE;
Andreas Schirr, Hamburg, DE;
Rainer Schliesser, Stuhr, DE;
Norbert Wittschief, Achim, DE;
Rainer Treptow, Norderstedt, DE;
Gerd Joachim Eckert, Hamburg, DE;
Andreas Schirr, Hamburg, DE;
Rainer Schliesser, Stuhr, DE;
Norbert Wittschief, Achim, DE;
Eppendorf AG, Hamburg, DE (US);
Abstract
The invention relates to a method for photometrically investigating sample radiations of at least one sample, which are caused by the radiation of N emitter elements of at least one radiation element wherein said N emitter elements are emitting radiation during time periods which at least partially overlap, to detect the sample radiation of at least two samples as a sum signal during time periods which at least partially overlap and to evaluate the sample radiation of at least one individual sample from said sum signal.