Gerald Lee Gisler

Title: Gerald Lee Gisler: Innovator in Probe Systems and Microscopy

Introduction

Gerald Lee Gisler is a notable inventor based in St. Paul, Oregon, recognized for his contributions to the field of probe systems and microscopy. With a total of two patents to his name, Gisler has made significant advancements in imaging devices and related technologies.

Latest Patents

Gisler's latest patents include "Probe systems including imaging devices with objective lens isolators, and related methods." This patent describes a probe system that features an enclosure designed to house a substrate containing one or more devices under test (DUTs). The system incorporates a testing assembly and an imaging device, which includes an objective lens and an isolator to minimize electromagnetic noise. Another patent, "Microscopes with objective assembly crash detection and methods of utilizing the same," outlines a microscope that includes an orientation detection circuit to monitor the relative orientation between the microscope body and the objective assembly, ensuring precision in operation.

Career Highlights

Gerald Lee Gisler is currently employed at FormFactor, Inc., where he continues to innovate and develop advanced technologies in his field. His work has contributed to enhancing the functionality and reliability of imaging systems used in various applications.

Collaborations

Gisler has collaborated with talented individuals such as Kazuki Negishi and Yu-Wen Huang, further enriching his work through shared expertise and innovative ideas.

Conclusion

Gerald Lee Gisler's contributions to probe systems and microscopy demonstrate his commitment to advancing technology in these fields. His patents reflect a deep understanding of the challenges in imaging devices and provide solutions that enhance their performance.