Corona, CA, United States of America

George Ray Hirvela

This inventor holds 1 USPTO granted patent. Top assignee: Itt Corporation. Active years: 1998.

IDiyas Innovation Intelligence. (2026). Inventor Profile: George Ray Hirvela. Retrieved from https://idiyas.com/inventor/george-ray-hirvela-1w2faun8

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 1998

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1 patent (USPTO):Explore Patents

Title: George Ray Hirvela: Innovator in Integrated Circuit Testing

Introduction

George Ray Hirvela is a notable inventor based in Corona, California. He has made significant contributions to the field of integrated circuit testing. His innovative approach has led to the development of a unique locking mechanism that enhances the functionality of test clips used in this technology.

Latest Patents

Hirvela holds a patent for a "Locking mechanism for IC test clip." This invention provides a mechanism as part of a test clip for securely locking the clip to the body of an integrated circuit device. The design includes locking fingers made of metal spring wire, which engage the IC body at its corner regions. The mechanism operates by utilizing a shaft that, when pushed down, deflects the locking fingers inwardly, allowing them to securely grip the IC body.

Career Highlights

Hirvela is currently employed at Itt Corporation, where he continues to work on innovative solutions in the field of electronics. His expertise in integrated circuit technology has positioned him as a valuable asset to his company and the industry at large.

Collaborations

Hirvela collaborates with Marik Balyasny, contributing to the advancement of technology in their field. Their teamwork exemplifies the importance of collaboration in driving innovation.

Conclusion

George Ray Hirvela's contributions to integrated circuit testing through his patented locking mechanism demonstrate his commitment to innovation. His work continues to influence the industry and improve the functionality of electronic devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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