George M Belansek

Title: Innovations by George M Belansek

Introduction

George M Belansek is an accomplished inventor based in Milton, VT (US). He is known for his significant contributions to the field of integrated circuit testing. His innovative approach has led to the development of a unique system that enhances the efficiency of Built-In Self-Test (BIST) operations.

Latest Patents

Belansek holds a patent for a "System and method of reducing test time via address aware BIST circuitry." This patent describes a method for executing a BIST operation on integrated circuit memory arrays. The process involves initiating a first BIST sequence, incrementing each address for the arrays, and determining a maximum valid address. The method effectively reduces testing time by engaging a first mode that prevents BIST testing in arrays that have reached their maximum valid address. A second BIST sequence is then initiated based on the signals received from all connected arrays.

Career Highlights

Belansek has made notable strides in his career, particularly while working at International Business Machines Corporation (IBM). His work has focused on improving the reliability and efficiency of memory testing in integrated circuits. With a patent portfolio that includes 1 patent, he has established himself as a key figure in the field of electronic testing.

Collaborations

Throughout his career, Belansek has collaborated with talented individuals such as Kevin William Gorman and Kiran K Narayan. These collaborations have fostered innovation and have contributed to the advancement of technology in their respective fields.

Conclusion

George M Belansek's contributions to the field of integrated circuit testing exemplify the spirit of innovation. His patented methods not only enhance testing efficiency but also pave the way for future advancements in technology.